{"product_id":"models-in-hardware-testing-lecture-notes-of-the-forum-in-honor-of-christian-landrault-9789400730939","title":"Models in Hardware Testing: Lecture Notes of the Forum in Honor of Christian Landrault","description":"\u003cp\u003eContributing Authors. Preface. To Christian: a Real Test \u0026amp; Taste Expert. From LAAS to LIRMM and Beyond.\u003c\/p\u003e \u003cp\u003e1. Open Defects in Nanometer Technologies; \u003cem\u003eJ. Figueras, R. Rodríguez-Montañés, D. Arumí\u003c\/em\u003e\u003c\/p\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e2. Models for Bridging Defects; \u003cem\u003eM. Renovell, F. Azais, J. Figueras, R. Rodriguez-Montanes, D. Arumi\u003c\/em\u003e\u003c\/p\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e3. Models for Delay Faults; \u003cem\u003eS.M. Reddy\u003c\/em\u003e\u003c\/p\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e4. Fault Modeling for Simulation and ATPG; \u003cem\u003eB.Becker, I.Polian\u003c\/em\u003e\u003c\/p\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e5. Generalized Fault Modeling for Logic Diagnosis; \u003cem\u003eH.-J. Wunderlich, S. Holst\u003c\/em\u003e\u003c\/p\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e6. Models in Memory Testing; \u003cem\u003eS.Di Carlo, P.Prinetto\u003c\/em\u003e\u003c\/p\u003e \u003cp\u003e\u003c\/p\u003e \u003cp\u003e7. Models for Power-Aware Testing; \u003cem\u003eP.Girard, H.-J.Wunderlich\u003c\/em\u003e\u003c\/p\u003e\u003csup\u003e \u003cp\u003e\u003c\/p\u003e\u003c\/sup\u003e \u003cp\u003e8. Physical Fault Models and Fault Tolerance; \u003cem\u003eJ.Arlat, Y.Crouzet\u003c\/em\u003e\u003c\/p\u003e \u003cp\u003eIndex.\u003c\/p\u003e\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e \u003ca href=\"https:\/\/sureshotbooks-com.myshopify.com\/search?type=product%2Carticle%2Cpage\u0026amp;q=AUTH-2299929\"\u003eHans-Joachim Wunderlich\u003c\/a\u003e\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Springer\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 03\/01\/2012\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 257\u003cbr\u003e\u003cb\u003eBinding Type:\u003c\/b\u003e Paperback\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 0.85lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.21h x 6.14w x 0.57d\u003cbr\u003e\u003cb\u003eISBN13:\u003c\/b\u003e 9789400730939\u003cbr\u003e\u003cb\u003eISBN10:\u003c\/b\u003e 9400730934\u003cbr\u003e\u003cb\u003eBISAC Categories:\u003c\/b\u003e\u003cbr\u003e- \u003ca href=\"https:\/\/sureshotbooks-com.myshopify.com\/search?type=product%2Carticle%2Cpage\u0026amp;q=CAT-TEC\"\u003eTechnology \u0026amp; Engineering\u003c\/a\u003e | \u003ca href=\"https:\/\/sureshotbooks-com.myshopify.com\/search?type=product%2Carticle%2Cpage\u0026amp;q=BISAC-TEC008010\"\u003eElectronics | Circuits | General\u003c\/a\u003e\u003cbr\u003e- \u003ca href=\"https:\/\/sureshotbooks-com.myshopify.com\/search?type=product%2Carticle%2Cpage\u0026amp;q=CAT-COM\"\u003eComputers\u003c\/a\u003e | \u003ca href=\"https:\/\/sureshotbooks-com.myshopify.com\/search?type=product%2Carticle%2Cpage\u0026amp;q=BISAC-COM014000\"\u003eComputer Science\u003c\/a\u003e\u003cbr\u003e- \u003ca href=\"https:\/\/sureshotbooks-com.myshopify.com\/search?type=product%2Carticle%2Cpage\u0026amp;q=CAT-COM\"\u003eComputers\u003c\/a\u003e | \u003ca href=\"https:\/\/sureshotbooks-com.myshopify.com\/search?type=product%2Carticle%2Cpage\u0026amp;q=BISAC-COM067000\"\u003eHardware | General\u003c\/a\u003e\u003cbr\u003e\u003cp\u003e\u003ci\u003eThis title is not returnable\u003c\/i\u003e\u003cbr\u003e\u003c\/p\u003e","brand":"Springer","offers":[{"title":"Default Title","offer_id":44697334874349,"sku":"9789400730939","price":164.98,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0550\/8097\/6621\/products\/img_8207c1bb-8eb1-4f2a-bac7-d30f224e8937.jpg?v=1703816176","url":"https:\/\/sureshotbooks.com\/es\/products\/models-in-hardware-testing-lecture-notes-of-the-forum-in-honor-of-christian-landrault-9789400730939","provider":"SureShot Books Publishing LLC","version":"1.0","type":"link"}