{"product_id":"secondary-ion-mass-spectrometry-applications-for-depth-profiling-and-surface-characterization-9781606505885","title":"Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization","description":"This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e \u003ca href=\"https:\/\/sureshotbooks-com.myshopify.com\/search?type=product%2Carticle%2Cpage\u0026amp;q=AUTH-9609884\"\u003eFred Stevie\u003c\/a\u003e\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Momentum Press\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 09\/15\/2015\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 277\u003cbr\u003e\u003cb\u003eBinding Type:\u003c\/b\u003e Paperback\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 0.86lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.00h x 6.00w x 0.61d\u003cbr\u003e\u003cb\u003eISBN13:\u003c\/b\u003e 9781606505885\u003cbr\u003e\u003cb\u003eISBN10:\u003c\/b\u003e 1606505882\u003cbr\u003e\u003cb\u003eBISAC Categories:\u003c\/b\u003e\u003cbr\u003e- \u003ca href=\"https:\/\/sureshotbooks-com.myshopify.com\/search?type=product%2Carticle%2Cpage\u0026amp;q=CAT-TEC\"\u003eTechnology \u0026amp; Engineering\u003c\/a\u003e | \u003ca href=\"https:\/\/sureshotbooks-com.myshopify.com\/search?type=product%2Carticle%2Cpage\u0026amp;q=BISAC-TEC021000\"\u003eMaterials Science | General\u003c\/a\u003e\u003cbr\u003e\u003cbr\u003e\u003cp\u003e\u003cb\u003eAbout the Author\u003c\/b\u003e\u003cbr\u003eSenior Researcher, North Carolina State University\u003c\/p\u003e","brand":"Momentum Press","offers":[{"title":"Default Title","offer_id":44523479105773,"sku":"9781606505885","price":79.95,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0550\/8097\/6621\/products\/img_78e7685c-216d-4aa9-bd0d-3f19cc13ef78.jpg?v=1701319831","url":"https:\/\/sureshotbooks.com\/products\/secondary-ion-mass-spectrometry-applications-for-depth-profiling-and-surface-characterization-9781606505885","provider":"SureShot Books Publishing LLC","version":"1.0","type":"link"}