Description
The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
Author: Daniel J. D. Eric J. Sullivan Carleton
Publisher: de Gruyter
Published: 10/10/2022
Pages: 128
Binding Type: Paperback
Weight: 0.48lbs
Size: 9.61h x 6.69w x 0.28d
ISBN13: 9781501524783
ISBN10: 150152478X
BISAC Categories:
- Technology & Engineering | Materials Science | Electronic Materials
- Science | Chemistry | Analytic
- Technology & Engineering | Electronics | General
About the Author
Dr. Daniel J. D. Sullivan
attended Cal & U. C. San Diego. Managed: FA, Reliability and Materials labs. Currently in sales and marketing at EAG labs. He has also written a non-technical book, "Don't Date Crazy" by DJDS, and published a board game called Infection.
Dr. Eric J. Carleton
is a technology developer and consultant who has incubated multiple technology startups, founded Arrhenius, a failure analysis firm, and serves clients in a wide array of industries on scientific analysis and litigation matters.