Description
Contributing Authors. Preface. To Christian: a Real Test & Taste Expert. From LAAS to LIRMM and Beyond.
1. Open Defects in Nanometer Technologies; J. Figueras, R. Rodríguez-Montañés, D. Arumí
2. Models for Bridging Defects; M. Renovell, F. Azais, J. Figueras, R. Rodriguez-Montanes, D. Arumi
3. Models for Delay Faults; S.M. Reddy
4. Fault Modeling for Simulation and ATPG; B.Becker, I.Polian
5. Generalized Fault Modeling for Logic Diagnosis; H.-J. Wunderlich, S. Holst
6. Models in Memory Testing; S.Di Carlo, P.Prinetto
7. Models for Power-Aware Testing; P.Girard, H.-J.Wunderlich
8. Physical Fault Models and Fault Tolerance; J.Arlat, Y.Crouzet
Index.
Author: Hans-Joachim Wunderlich
Publisher: Springer
Published: 03/01/2012
Pages: 257
Binding Type: Paperback
Weight: 0.85lbs
Size: 9.21h x 6.14w x 0.57d
ISBN13: 9789400730939
ISBN10: 9400730934
BISAC Categories:
- Technology & Engineering | Electronics | Circuits | General
- Computers | Computer Science
- Computers | Hardware | General
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