Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization Paperback Momentum Press
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Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization Paperback Momentum Press

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization

Momentum Press
Price:
$79.95

Description

This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.

Author: Fred Stevie
Publisher: Momentum Press
Published: 09/15/2015
Pages: 277
Binding Type: Paperback
Weight: 0.86lbs
Size: 9.00h x 6.00w x 0.61d
ISBN13: 9781606505885
ISBN10: 1606505882
BISAC Categories:
- Technology & Engineering | Materials Science | General

About the Author
Senior Researcher, North Carolina State University