Description
Introduction.- Methods.- Defects in Nanowires.- Defect Dynamics in Nanowires.- Interfaces in Nanowire Axial Heterostructures.- Conclusions and Future Work.
Author: James A. Gott
Publisher: Springer
Published: 01/31/2023
Pages: 143
Binding Type: Paperback
Weight: 0.51lbs
Size: 9.21h x 6.14w x 0.34d
ISBN13: 9783030940645
ISBN10: 3030940640
BISAC Categories:
- Technology & Engineering | Electronics | Semiconductors
- Technology & Engineering | Materials Science | Electronic Materials
- Science | Chemistry | Analytic
Author: James A. Gott
Publisher: Springer
Published: 01/31/2023
Pages: 143
Binding Type: Paperback
Weight: 0.51lbs
Size: 9.21h x 6.14w x 0.34d
ISBN13: 9783030940645
ISBN10: 3030940640
BISAC Categories:
- Technology & Engineering | Electronics | Semiconductors
- Technology & Engineering | Materials Science | Electronic Materials
- Science | Chemistry | Analytic
About the Author
Dr James Gott obtained his BSc MPhys from the University of Warwick in 2016. He then joined the electron microscopy group at Warwick where he obtained his PhD in Physics in 2020. His research interests include utilising advanced electron microscopy techniques to study nano materials.